Automating Energy Bandgap Measurements in Semiconductors Using LabVIEW

Amit Garg; Reena Sharma; Vishal Dhingra

Amit Garg University of Delhi
Reena Sharma University of Delhi
Vishal Dhingra University of Delhi

Abstract

In this paper, we report the development of an automated system for energy bandgap and resistivity measurement of a semiconductor sample using Four-Probe method for use in the undergraduate laboratory of Physics and Electronics students. The automated data acquisition and analysis system has been developed using National Instruments USB-6008 DAQ Card and Student version of LabVIEW 8.5 Development System Software. One of the objectives of the development has been to motivate students to the use of computers in science experimentation/education besides other advantages. The developed system performs energy bandgap measurements by analyzing resistivity variations for the semiconductor sample over a wide range of temperature. The acquired data is also available for both online and offline analysis. The final results are generated in the form of a report for onward use and verification.

References

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http://sine.ni.com/nips/cds/print/p/lang/en/nid/14604